This two-volume set contains 153 papers which constitute the Proceedings of the International Conference on Diffusion in Materials, held in Kyoto, Japan. 174 scientists from 55 countries registered for this conference.

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eBook:

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ToC:

Table of contents

Editors:

K.H. Kuo and J.P. Zhang

DOI:

https://doi.org/10.4028/b-zYBX51

THEMA:

TGM

BISAC:

TEC021000

Keywords:

Bi-Sr-Ca-Cu-O, Critical Current Density, Energy Dispersive Spectroscopy, Grain Boundary, High Resolution Electron Microscopy (HREM), Intergrowth, MBE Growth, Oxygen-Rich Area, Plateau Effect, SmBa₂Cu₃O_7-δ, Stacking Fault, STM, Structural Modulation, Structure Determination, Superconductor, TEM Observation, Thin Film, UHR-HVEM, Visualization, YBa₂Cu₃O_7.7

Pages:

216

Year:

1993

ISBN-13:

9780878496631

ISBN-13 (CD):

9783038597933

ISBN-13 (eBook):

9783035704785

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