Rietveld Refinement employing X-Ray Data on CaWO4 from Different Powder Diffraction Geometries
p.89
p.89
Stress Measurements in Textured Materials
p.97
p.97
Interpretation of X-Ray Stress Measurements
p.111
p.111
X-Ray Analysis of Residual Stresses and Textures in Thin Coatings
p.117
p.117
Oblique-Texture Electron Diffraction in Powder Crystallography
p.125
p.125
Texture Investigation by Means of Model Functions
p.139
p.139
Estimation of the Texture Component Parameters in Cubic Metals
p.145
p.145
Application of the ADC Method for ODF Approximation in Cases of Low Crystal and Sample Symmetries
p.151
p.151
XRD Texture Investigations with the Employment of Location Sensitive Measuring Technique
p.157
p.157
Oblique-Texture Electron Diffraction in Powder Crystallography
Abstract:
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Periodical:
Materials Science Forum (Volumes 133-136)
Pages:
125-138
Citation:
Online since:
January 1993
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© 1993 Trans Tech Publications Ltd. All Rights Reserved
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