Interpretation of X-Ray Stress Measurements
p.111
p.111
X-Ray Analysis of Residual Stresses and Textures in Thin Coatings
p.117
p.117
Oblique-Texture Electron Diffraction in Powder Crystallography
p.125
p.125
Texture Investigation by Means of Model Functions
p.139
p.139
Estimation of the Texture Component Parameters in Cubic Metals
p.145
p.145
Application of the ADC Method for ODF Approximation in Cases of Low Crystal and Sample Symmetries
p.151
p.151
XRD Texture Investigations with the Employment of Location Sensitive Measuring Technique
p.157
p.157
New Opportunities in X-Ray Texture Analysis of two Phase Ti-Aluminides by Application of a Proportional Scintillation Detector and the Component Method to ODF Reproduction
p.163
p.163
Texture Analysis of Thin Films on Single Crystalline Substrates
p.169
p.169
Estimation of the Texture Component Parameters in Cubic Metals
Abstract:
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Periodical:
Materials Science Forum (Volumes 133-136)
Pages:
145-150
Citation:
Online since:
January 1993
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© 1993 Trans Tech Publications Ltd. All Rights Reserved
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