New Opportunities in X-Ray Texture Analysis of two Phase Ti-Aluminides by Application of a Proportional Scintillation Detector and the Component Method to ODF Reproduction

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Periodical:

Materials Science Forum (Volumes 133-136)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

163-168

DOI:

10.4028/www.scientific.net/MSF.133-136.163

Citation:

G. Bermig et al., "New Opportunities in X-Ray Texture Analysis of two Phase Ti-Aluminides by Application of a Proportional Scintillation Detector and the Component Method to ODF Reproduction", Materials Science Forum, Vols. 133-136, pp. 163-168, 1993

Online since:

January 1993

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