Paper Titles

XRD Texture Investigations with the Employment of Location Sensitive Measuring Technique
p.157

New Opportunities in X-Ray Texture Analysis of two Phase Ti-Aluminides by Application of a Proportional Scintillation Detector and the Component Method to ODF Reproduction
p.163

Texture Analysis of Thin Films on Single Crystalline Substrates
p.169

X-Ray Diffraction Method for Monitoring of Texture Evolution in Layers
p.175

Texture Determination of PbZr_0.53Ti_0.47O₃ Thin Films by XRD and BKDP
p.181

The Ab-Initio Determination of Crystal Structures from their Powder Diffraction Patterns using a Combination of Entropy Maximisation and Likelihood Ranking
p.189

Application of a Simulated Annealing Approach in Powder Crystal Structure Analysis
p.195

Determination of Molecular Crystal Structures from X-Ray Powder Diffraction Data
p.201

Ab Initio Determination of Molecular Crystal Structures using Powder Diffraction Data from a Laboratory X-Ray Source
p.207

HomeMaterials Science ForumMaterials Science Forum Vols. 133-136Texture Determination of PbZr0.53Ti0.47O3 Thin...

Texture Determination of PbZr_0.53Ti_0.47O₃ Thin Films by XRD and BKDP

Article Preview

Abstract:

You might also be interested in these eBooks

$European Powder Diffraction EPDIC 2$ View Preview

Info:

Periodical:

Materials Science Forum (Volumes 133-136)

Pages:

181-188

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.133-136.181

Citation:

Cite this paper

Online since:

January 1993

Authors:

K.Z. Troost, A.J. Kinneging

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 1993 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: