X-Ray Diffraction Method for Monitoring of Texture Evolution in Layers
p.175
p.175
Texture Determination of PbZr0.53Ti0.47O3 Thin Films by XRD and BKDP
p.181
p.181
The Ab-Initio Determination of Crystal Structures from their Powder Diffraction Patterns using a Combination of Entropy Maximisation and Likelihood Ranking
p.189
p.189
Application of a Simulated Annealing Approach in Powder Crystal Structure Analysis
p.195
p.195
Determination of Molecular Crystal Structures from X-Ray Powder Diffraction Data
p.201
p.201
Ab Initio Determination of Molecular Crystal Structures using Powder Diffraction Data from a Laboratory X-Ray Source
p.207
p.207
Application of X-Ray Powder Diffraction for the Investigation of Polytype Structures in Metals and Alloys
p.213
p.213
Diffraction from Thin Layers
p.221
p.221
Glancing-Incidence X-Ray Analysis of Thin Films
p.231
p.231
Determination of Molecular Crystal Structures from X-Ray Powder Diffraction Data
Abstract:
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Periodical:
Materials Science Forum (Volumes 133-136)
Pages:
201-206
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Online since:
January 1993
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© 1993 Trans Tech Publications Ltd. All Rights Reserved
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