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HomeMaterials Science ForumMaterials Science Forum Vols. 133-136Glancing-Incidence X-Ray Analysis of Thin Films

Glancing-Incidence X-Ray Analysis of Thin Films

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Periodical:

Materials Science Forum (Volumes 133-136)

Pages:

231-236

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.133-136.231

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Online since:

January 1993

Authors:

D.K.G. De Boer, W.W. van den Hoogenhof

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© 1993 Trans Tech Publications Ltd. All Rights Reserved

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