Glancing-Incidence X-Ray Analysis of Thin Films

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Periodical:

Materials Science Forum (Volumes 133-136)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

231-236

DOI:

10.4028/www.scientific.net/MSF.133-136.231

Citation:

D.K.G. De Boer and W.W. van den Hoogenhof, "Glancing-Incidence X-Ray Analysis of Thin Films", Materials Science Forum, Vols. 133-136, pp. 231-236, 1993

Online since:

January 1993

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$35.00

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