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Paper Titles
Application of a Simulated Annealing Approach in Powder Crystal Structure Analysis
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Determination of Molecular Crystal Structures from X-Ray Powder Diffraction Data
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Ab Initio Determination of Molecular Crystal Structures using Powder Diffraction Data from a Laboratory X-Ray Source
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Application of X-Ray Powder Diffraction for the Investigation of Polytype Structures in Metals and Alloys
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Diffraction from Thin Layers
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Glancing-Incidence X-Ray Analysis of Thin Films
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Intermediate-Resolution Reciprocal-Space Mapper
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Locally Resolved X-Ray Investigations by Means of X-Ray Optics
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A New Apparatus for In-Situ X-Ray Diffraction
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HomeMaterials Science ForumMaterials Science Forum Vols. 133-136Diffraction from Thin Layers

Diffraction from Thin Layers

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Materials Science Forum (Volumes 133-136)

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221-230

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.133-136.221

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January 1993

Authors:

P.F. Fewster, N.L. Andrew

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© 1993 Trans Tech Publications Ltd. All Rights Reserved

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