Application of the ADC Method for ODF Approximation in Cases of Low Crystal and Sample Symmetries
p.151
p.151
XRD Texture Investigations with the Employment of Location Sensitive Measuring Technique
p.157
p.157
New Opportunities in X-Ray Texture Analysis of two Phase Ti-Aluminides by Application of a Proportional Scintillation Detector and the Component Method to ODF Reproduction
p.163
p.163
Texture Analysis of Thin Films on Single Crystalline Substrates
p.169
p.169
X-Ray Diffraction Method for Monitoring of Texture Evolution in Layers
p.175
p.175
Texture Determination of PbZr0.53Ti0.47O3 Thin Films by XRD and BKDP
p.181
p.181
The Ab-Initio Determination of Crystal Structures from their Powder Diffraction Patterns using a Combination of Entropy Maximisation and Likelihood Ranking
p.189
p.189
Application of a Simulated Annealing Approach in Powder Crystal Structure Analysis
p.195
p.195
Determination of Molecular Crystal Structures from X-Ray Powder Diffraction Data
p.201
p.201
X-Ray Diffraction Method for Monitoring of Texture Evolution in Layers
Abstract:
You might also be interested in these eBooks
Info:
Periodical:
Materials Science Forum (Volumes 133-136)
Pages:
175-180
Citation:
Online since:
January 1993
Authors:
Price:
Сopyright:
© 1993 Trans Tech Publications Ltd. All Rights Reserved
Share:
Citation: