XRD Texture Investigations with the Employment of Location Sensitive Measuring Technique

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Periodical:

Materials Science Forum (Volumes 133-136)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

157-162

Citation:

L. Wcislak et al., "XRD Texture Investigations with the Employment of Location Sensitive Measuring Technique", Materials Science Forum, Vols. 133-136, pp. 157-162, 1993

Online since:

January 1993

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$38.00

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