Paper Titles

Oblique-Texture Electron Diffraction in Powder Crystallography
p.125

Texture Investigation by Means of Model Functions
p.139

Estimation of the Texture Component Parameters in Cubic Metals
p.145

Application of the ADC Method for ODF Approximation in Cases of Low Crystal and Sample Symmetries
p.151

XRD Texture Investigations with the Employment of Location Sensitive Measuring Technique
p.157

New Opportunities in X-Ray Texture Analysis of two Phase Ti-Aluminides by Application of a Proportional Scintillation Detector and the Component Method to ODF Reproduction
p.163

Texture Analysis of Thin Films on Single Crystalline Substrates
p.169

X-Ray Diffraction Method for Monitoring of Texture Evolution in Layers
p.175

Texture Determination of PbZr_0.53Ti_0.47O₃ Thin Films by XRD and BKDP
p.181

HomeMaterials Science ForumMaterials Science Forum Vols. 133-136XRD Texture Investigations with the Employment of...

XRD Texture Investigations with the Employment of Location Sensitive Measuring Technique

Article Preview

Abstract:

You might also be interested in these eBooks

$European Powder Diffraction EPDIC 2$ View Preview

Info:

Periodical:

Materials Science Forum (Volumes 133-136)

Pages:

157-162

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.133-136.157

Citation:

Cite this paper

Online since:

January 1993

Authors:

L. Wcislak, Hans Joachim Bunge, C. Nauer-Gerhardt

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 1993 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: