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HomeMaterials Science ForumMaterials Science Forum Vols. 143-147The Identification of Intrinsic Vacancy Defects in...

The Identification of Intrinsic Vacancy Defects in CdTe

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Defects in Semiconductors 17

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Periodical:

Materials Science Forum (Volumes 143-147)

Pages:

397-398

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.143-147.397

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Online since:

October 1993

Authors:

B.K. Meyer, P. Omling, P. Emanuelsson

Keywords:

CdTe, Defect, Magnetic Resonance

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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