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HomeMaterials Science ForumMaterials Science Forum Vols. 143-147Phonon Spectroscopy of Defects Correlated with the...

Phonon Spectroscopy of Defects Correlated with the Diffusion of Zn into Si

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Defects in Semiconductors 17

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Periodical:

Materials Science Forum (Volumes 143-147)

Pages:

675-680

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.143-147.675

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Online since:

October 1993

Authors:

J. Staiger, P. Gross, K. Lassmann, Hartmut Bracht, Nicolaas Stolwijk

Keywords:

Diffusion, Double Acceptor, Phonon Spectroscopy, Si:Zn

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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