Thickness and Density Determination for Ni-C-Ni Ultrathin Film by Photoemission and X-Ray Fluorescence Measurements under Total External Reflection

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Periodical:

Materials Science Forum (Volumes 166-169)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

337-342

DOI:

10.4028/www.scientific.net/MSF.166-169.337

Citation:

E. Burattini et al., "Thickness and Density Determination for Ni-C-Ni Ultrathin Film by Photoemission and X-Ray Fluorescence Measurements under Total External Reflection", Materials Science Forum, Vols. 166-169, pp. 337-342, 1994

Online since:

July 1994

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$35.00

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