X-Ray Diffraction Studies and Ellipsometric Diagnostics of Thin α-Ti Growth Films in Plasma Activated Physical Vapour Deposition
p.313
p.313
An X-Ray Study of Thermally-Sprayed Metal Coatings
p.319
p.319
Characterization by XRPD of Diamond Films Grown on Titanium
p.325
p.325
Investigation of Thermal Aging of Ni/C-Multilayers by X-Ray Methods
p.331
p.331
Thickness and Density Determination for Ni-C-Ni Ultrathin Film by Photoemission and X-Ray Fluorescence Measurements under Total External Reflection
p.337
p.337
Structural Analysis and Residual Stress Measurements in a Natural Titanium Oxide Layer
p.343
p.343
In Situ Determination of the Residual Stress Field Induced by Air Oxidation, up to 1000 °C, in a 20% Cr 5% Al Ferritic Steel, by X-Ray Diffraction
p.349
p.349
In Situ Study of the Formation of Orientations during the High Temperature Oxidation of Copper
p.355
p.355
In Situ Study of the High Temperature Oxidation of X20CrMoV 12 1 in Air by means of X-Ray Diffraction
p.361
p.361
Thickness and Density Determination for Ni-C-Ni Ultrathin Film by Photoemission and X-Ray Fluorescence Measurements under Total External Reflection
Abstract:
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Periodical:
Materials Science Forum (Volumes 166-169)
Pages:
337-342
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Online since:
July 1994
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© 1994 Trans Tech Publications Ltd. All Rights Reserved
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