Thickness and Density Determination for Ni-C-Ni Ultrathin Film by Photoemission and X-Ray Fluorescence Measurements under Total External Reflection
p.337
p.337
Structural Analysis and Residual Stress Measurements in a Natural Titanium Oxide Layer
p.343
p.343
In Situ Determination of the Residual Stress Field Induced by Air Oxidation, up to 1000 °C, in a 20% Cr 5% Al Ferritic Steel, by X-Ray Diffraction
p.349
p.349
In Situ Study of the Formation of Orientations during the High Temperature Oxidation of Copper
p.355
p.355
In Situ Study of the High Temperature Oxidation of X20CrMoV 12 1 in Air by means of X-Ray Diffraction
p.361
p.361
Residual Stress in Plasma-Sprayed Ceramic Coatings
p.367
p.367
Phase Stability of NiCrAIY Powders for Plasma Sprayed Coatings
p.373
p.373
Characterization by X-Ray Diffraction of PZT (Pb(ZrxTi1-x)O3) Thin Films on Pt/TiN/BPSG/Si Substrate
p.379
p.379
Estimation of Short-Range Order Parameters in Cu-Cd Amorphous Alloys
p.387
p.387
In Situ Study of the High Temperature Oxidation of X20CrMoV 12 1 in Air by means of X-Ray Diffraction
Abstract:
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Periodical:
Materials Science Forum (Volumes 166-169)
Pages:
361-366
Citation:
Online since:
July 1994
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© 1994 Trans Tech Publications Ltd. All Rights Reserved
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