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HomeMaterials Science ForumMaterials Science Forum Vols. 166-169

Materials Science Forum Vols. 166-169

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.166-169

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Table of Contents

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Paper Title Page

X-Ray Diffraction Analysis of High-T_c Superconductors

Authors: I.V. Zakharchenko, Mamoun Muhammed, K.V. Rao

91

Generalization of Empirical Texture Correction and Application to Joint Refinement

Authors: R. Cerný, V. Valvoda, M. Chládek

97

Correction of the Microabsorption Effect in Rietveld Analysis

Authors: W. Pitschke, N. Mattern, H.U. Hermann

103

Degree of Crystallinity Calculations for Polymer and Catalyst Materials

Authors: S. Justi, E.S. Sherman, M. Olariu

109

Angle-Dispersive Powder-Diffraction at High Pressure

Authors: M.I. McMahon, R.J. Nelmes

117

An Overview of NIST Powder Diffraction Standard Reference Materials

Authors: James P. Cline

127

Experimental Whole Powder Pattern Intensity Calibration in X-Ray Powder Diffractometry (XRPD)

Authors: A. Kern, W. Eysel

135

Grazing Incidence Diffraction with a Sealed Tube X-Ray Source

Authors: P. Van der Sluis

141

Phase Transformation of NiTi Alloy Studied with an Inel X-Ray Position Sensitive Detector

Authors: Henryk Morawiec, Tomasz Goryczka, Artur Chrobak

147

Use of an X-Ray Imaging Plate for Stress Analysis

Authors: A. Schubert, B. Kämpfe, M. Ermrich, E. Auerswald, K. Tränkner

151

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