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Materials Science Forum Vols. 166-169

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.166-169

ToC:

Table of Contents

Paper Title Page

The Application of High Resolution X-Ray Diffraction for the Investigation of the Process of Elastic Strain Relaxation in InGaAs Quantum Well
Authors: N. Faleev, R. Stabenow, M. Sinitsyn, B. Yavich, A. Haase, A. Grudsky
293
Preparation and Properties of W/Si Multilayer X-Ray Reflectors
Authors: Hans Joachim Kühn, J. Kräußlich, G. Natura
299
Investigation of the Behaviour of Stress in Metallization Thin Films for Microelectronics during Thermal Cycling using High-Temperature X-Ray Diffraction
Authors: G.M. Zorn, M. Schneegans
307
X-Ray Diffraction Studies and Ellipsometric Diagnostics of Thin α-Ti Growth Films in Plasma Activated Physical Vapour Deposition
Authors: Harm Wulff, H. Steffen, V. Krasemann, J. Klimke
313
An X-Ray Study of Thermally-Sprayed Metal Coatings
Authors: I. Iordanova, K.S. Forcey, J. Valtcheva, B. Gergov
319
Characterization by XRPD of Diamond Films Grown on Titanium
Authors: G. Cappuccio, V. Sessa, M.L. Terranova, C. Veroli
325
Investigation of Thermal Aging of Ni/C-Multilayers by X-Ray Methods
Authors: R. Krawietz, B. Wehner, T. Sebald, H. Mai, Reiner Dietsch
331
Thickness and Density Determination for Ni-C-Ni Ultrathin Film by Photoemission and X-Ray Fluorescence Measurements under Total External Reflection
Authors: E. Burattini, G. Cappuccio, V. Sessa, I.Yu. Kharitonov, M.V. Kovalchuk, N.N. Novikova, A.N. Sosphenov, S.I. Zheludeva
337
Structural Analysis and Residual Stress Measurements in a Natural Titanium Oxide Layer
Authors: M. Härting, G. Fritsch
343
In Situ Determination of the Residual Stress Field Induced by Air Oxidation, up to 1000 °C, in a 20% Cr 5% Al Ferritic Steel, by X-Ray Diffraction
Authors: Frédéric Bernard, E. Sciora, M. Lambertin, N. Gerard
349

Showing 41 to 50 of 126 Paper Titles

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