Modification of RTOF-Devices for Investigation in Solid State Physics and Material Science
p.273
p.273
Characterization of Multilayers for Neutron Optics
p.279
p.279
X-Ray Diffraction Investigations of Thin Gold Films
p.287
p.287
The Application of High Resolution X-Ray Diffraction for the Investigation of the Process of Elastic Strain Relaxation in InGaAs Quantum Well
p.293
p.293
Preparation and Properties of W/Si Multilayer X-Ray Reflectors
p.299
p.299
Investigation of the Behaviour of Stress in Metallization Thin Films for Microelectronics during Thermal Cycling using High-Temperature X-Ray Diffraction
p.307
p.307
X-Ray Diffraction Studies and Ellipsometric Diagnostics of Thin α-Ti Growth Films in Plasma Activated Physical Vapour Deposition
p.313
p.313
An X-Ray Study of Thermally-Sprayed Metal Coatings
p.319
p.319
Characterization by XRPD of Diamond Films Grown on Titanium
p.325
p.325
Preparation and Properties of W/Si Multilayer X-Ray Reflectors
Abstract:
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Periodical:
Materials Science Forum (Volumes 166-169)
Pages:
299-306
Citation:
Online since:
July 1994
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© 1994 Trans Tech Publications Ltd. All Rights Reserved
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