Preparation and Properties of W/Si Multilayer X-Ray Reflectors

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 166-169)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

299-306

DOI:

10.4028/www.scientific.net/MSF.166-169.299

Citation:

H. J. Kühn et al., "Preparation and Properties of W/Si Multilayer X-Ray Reflectors", Materials Science Forum, Vols. 166-169, pp. 299-306, 1994

Online since:

July 1994

Export:

Price:

$35.00

In order to see related information, you need to Login.