The Use of Low Energy Positrons to Probe Defects in Langmuir-Blodgett Films

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Periodical:

Materials Science Forum (Volumes 175-178)

Edited by:

Yuan-Jin He, Bi-Song Cao and Y.C. Jean

Pages:

533-536

DOI:

10.4028/www.scientific.net/MSF.175-178.533

Citation:

F.A. Smith et al., "The Use of Low Energy Positrons to Probe Defects in Langmuir-Blodgett Films ", Materials Science Forum, Vols. 175-178, pp. 533-536, 1995

Online since:

November 1994

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$35.00

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