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HomeMaterials Science ForumMaterials Science Forum Vols. 185-188Stress Generation during Anodic Oxidation of...

Stress Generation during Anodic Oxidation of Tungsten

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Passivation of Metals and Semiconductors

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Periodical:

Materials Science Forum (Volumes 185-188)

Pages:

407-418

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.185-188.407

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Online since:

March 1995

Authors:

Su-Il Pyun, J.D. Kim, R.A. Oriani

Keywords:

Anodic Tungsten Oxide Film, Applied Current Density, Beam Deflection Technique, Oxide Growth Kinetics, Stress Generation

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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