This comprehensive volume covers practically all aspects concerning the passivity of metallic and semiconductor materials. Recent advances resulting from new materials in new environments, from metals and insulating films in multilayer structures, and from the chemical side of semiconductor technology are presented.

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eBook:

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ToC:

Table of contents

Editors:

K.E. Heusler

DOI:

https://doi.org/10.4028/b-59QtCG

THEMA:

TGM

BISAC:

TEC021000

Keywords:

Aluminum (Al), Anodic Films, Anodic Oxide Films, Breakdown of Passivity, Breakdown Voltage, Chromium, Dissolution, Ellipsometry, Impedance Spectroscopy, Iron, Passivation, Passive Films, Passivity, Photoelectrochemistry, Pitting, Pitting Corrosion, Scanning Electron Microscope (SEM), Semiconductor, Stainless Steel (SS), X-Ray Photoelectron Spectroscopy (XPS)

Details:

Proceedings of the 7th International Symposium on the Passivity of Metals and Semiconductors held in Clausthal, Germany, August 1994

Pages:

1112

Year:

1995

ISBN-13 (hardcover):

9780878496921

ISBN-13 (CD):

9783038598114

ISBN-13 (eBook):

9783035704952

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