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HomeMaterials Science ForumMaterials Science Forum Vols. 189-190An HREM Image Analysis for Geometrical Mismatch at...

An HREM Image Analysis for Geometrical Mismatch at Interfaces

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Interfaces II

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Periodical:

Materials Science Forum (Volumes 189-190)

Pages:

155-160

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.189-190.155

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Online since:

July 1995

Authors:

Heng Qiang Ye

Keywords:

Geometrical Mismatch, High Resolution Electron Microscopy (HREM), Interface

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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