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HomeMaterials Science ForumMaterials Science Forum Vols. 189-190HRTEM Study of Atomic Faceting Interfaces of Σ=3...

HRTEM Study of Atomic Faceting Interfaces of Σ=3 NiSi₂/Si on (011) Si Substrate

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Interfaces II

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Periodical:

Materials Science Forum (Volumes 189-190)

Pages:

135-142

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.189-190.135

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Online since:

July 1995

Authors:

W.J. Chen, F.-R. Chen

Keywords:

Atomic Faceting Interfaces, High Resolution Electron Microscopy (HREM), Σ=3 NiSi₂/Si

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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