Characterisation of the Mechanical Properties of Thin Film Cantilevers with the Atomic Force Microscope

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Periodical:

Materials Science Forum (Volumes 189-190)

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Edited by:

B.C. Muddle

Pages:

107-114

Citation:

C.J. Drummond and T.J. Senden, "Characterisation of the Mechanical Properties of Thin Film Cantilevers with the Atomic Force Microscope", Materials Science Forum, Vols. 189-190, pp. 107-114, 1995

Online since:

July 1995

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$38.00

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