Interfacial Effects on Fatigue and Fracture in Discontinuously Reinforced Metal Matrix Composites
p.43
p.43
Interfaces in Polymeric Materials
p.57
p.57
Nanostructured Materials - Scientific Background and Technological Perspectives
p.67
p.67
Segregation to Boundaries and Interfaces in Solids
p.81
p.81
Surface/Interface X-Ray Diffraction
p.95
p.95
Characterisation of the Mechanical Properties of Thin Film Cantilevers with the Atomic Force Microscope
p.107
p.107
Comparison of STEM and Atom Probe Methods for Chemical Analysis of Grain Boundaries in Commercial Al Alloys
p.115
p.115
Interfacial Structure of a Σ9 and Defect Structure at Junctions of Σ3-Σ9-Σ3 in Diamond Film
p.121
p.121
Grain Boundary Structure in Titanium Diboride
p.129
p.129
Surface/Interface X-Ray Diffraction
Abstract:
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Periodical:
Materials Science Forum (Volumes 189-190)
Pages:
95-106
Citation:
Online since:
July 1995
Authors:
Keywords:
2D Diffraction Rods, Ag, Au, Bonding Distance of Surface Atoms, Buried Interfaces, C60 Bucky Balls, Crystal Truncation Rods (CTR), Cu, Difference Fourier Map, Dimer-Adatom-Stacking-Fault (DAS) Model, Epitaxial Relationship, Fractional-Order Reflections, Ge, Grazing-Incidence X-Ray Scattering (GIXS), In-Plane Scans, InSb, Integer-Order Reflections, Interface X-Ray Diffraction, Multilayer, NiSi2, Patterson Function, Roughening Transition, Silicon, Specular Reflection, Standing Wave Method, Surface Reconstruction, Surface Roughness (SR), Surface X-Ray Diffraction, Synchrotron Radiation (XRD), Total External Reflection
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© 1995 Trans Tech Publications Ltd. All Rights Reserved
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