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Nanostructured Materials - Scientific Background and Technological Perspectives
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Segregation to Boundaries and Interfaces in Solids
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Surface/Interface X-Ray Diffraction
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Characterisation of the Mechanical Properties of Thin Film Cantilevers with the Atomic Force Microscope
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Comparison of STEM and Atom Probe Methods for Chemical Analysis of Grain Boundaries in Commercial Al Alloys
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HomeMaterials Science ForumMaterials Science Forum Vols. 189-190Segregation to Boundaries and Interfaces in Solids

Segregation to Boundaries and Interfaces in Solids

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Interfaces II

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Periodical:

Materials Science Forum (Volumes 189-190)

Pages:

81-94

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.189-190.81

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Online since:

July 1995

Authors:

R.G. Faulkner

Keywords:

Analytical Electron Microscopy, Grain Boundary, Modeling, Radiation-Induced Segregation, Segregation

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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