Paper Titles

Optical Investigation on Delta Doped PHEMT Structures
p.255

Optical Properties of Zn_1-xCd_xSe/ZnSe Quantum Well Lasers Fabricated by Molecular Beam Epitaxy
p.261

Optical and Electrical Properties of ZnOCdTe Thin Films
p.267

SIMS-ETAAS Characterisation of Background Impurites in CdZnTe Bulk Samples
p.273

XPS and EPMA Study of CVD Diamond, Hydrogenated Amorphous Carbon and Graphite Films
p.279

Microstructure and Phase Morphology of Diamond Thin Films by Synchrotron Radiation X-Ray Diffraction
p.285

Morphological and Structural Investigations of Diamond Films Deposited on Substrates Covered by Carbon Layers
p.291

Spectroscopic Characterization of a Substituted Phthalocyanine Thin Film Deposited by the Langmuir-Blodgett Technique
p.297

Electrical Properties of C₆₀ Thin Films: Preliminary Results
p.303

HomeMaterials Science ForumMaterials Science Forum Vol. 203Spectroscopic Characterization of a Substituted...

Spectroscopic Characterization of a Substituted Phthalocyanine Thin Film Deposited by the Langmuir-Blodgett Technique

Article Preview

Abstract:

You might also be interested in these eBooks

Advances in Crystal Growth

Info:

Periodical:

Materials Science Forum (Volume 203)

Pages:

297-302

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.203.297

Citation:

Cite this paper

Online since:

February 1996

Authors:

L. Pasimeni, R. Rella, L. Troisi, L. Valli

Keywords:

EPR Spectroscopy, Langmuir-Blodgett Film, Phthalocyanine, Polarized UV-VIS

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 1996 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: