SIMS-ETAAS Characterisation of Background Impurites in CdZnTe Bulk Samples

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Periodical:

Edited by:

A.M. Mancini, C. Paorici and M.L. Terranova

Pages:

273-278

DOI:

10.4028/www.scientific.net/MSF.203.273

Citation:

C. Gerardi et al., "SIMS-ETAAS Characterisation of Background Impurites in CdZnTe Bulk Samples", Materials Science Forum, Vol. 203, pp. 273-278, 1996

Online since:

February 1996

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$35.00

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