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HomeMaterials Science ForumMaterials Science Forum Vol. 203SIMS-ETAAS Characterisation of Background...

SIMS-ETAAS Characterisation of Background Impurites in CdZnTe Bulk Samples

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Periodical:

Materials Science Forum (Volume 203)

Pages:

273-278

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.203.273

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Online since:

February 1996

Authors:

C. Gerardi, E. Milella, F. Campanella, S. Bernardi

Keywords:

Background Impurities, CdTe, CdZnTe, ETAAS, HgCdTe, SIMS

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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