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HomeMaterials Science ForumMaterials Science Forum Vol. 203Optical and Structural Characterization of Single...

Optical and Structural Characterization of Single Quantum Wells of InGaAs on GaAs MOCVD Grown Both on Exactly Oriented and Misoriented Substrates

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Periodical:

Materials Science Forum (Volume 203)

Pages:

249-254

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.203.249

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Online since:

February 1996

Authors:

A. Di Paola, D.M. Ritchie, M. Riva, F. Vidimari, Cesare Frigeri, A. Brinciotti

Keywords:

Carrier Localization, In Diffusion, In Segregation, InGaAs, Macrostep, Miscut Substrates, MOCVD, PL, Strain, TEM, X-Ray Diffraction (XRD)

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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