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HomeMaterials Science ForumMaterials Science Forum Vol. 203X-Ray Diffraction Study of Lattice Strain...

X-Ray Diffraction Study of Lattice Strain Relaxation in Mismatched III-V Heteroepitaxial Layers

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Periodical:

Materials Science Forum (Volume 203)

Pages:

223-230

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.203.223

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Online since:

February 1996

Authors:

P. Franzosi, L. Francesio, S. Gennari

Keywords:

Compound Semiconductor, Heteroepitaxial Layers, Lattice Strains

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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