Lattice Strain Analysis of VPE-Grown ZnS Epitaxial Layers on (001) GaAs by RBS - Channeling and High Resolution XRD Measurements

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Edited by:

A.M. Mancini, C. Paorici and M.L. Terranova

Pages:

237-242

DOI:

10.4028/www.scientific.net/MSF.203.237

Citation:

G. Leo et al., "Lattice Strain Analysis of VPE-Grown ZnS Epitaxial Layers on (001) GaAs by RBS - Channeling and High Resolution XRD Measurements", Materials Science Forum, Vol. 203, pp. 237-242, 1996

Online since:

February 1996

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