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HomeMaterials Science ForumMaterials Science Forum Vol. 203Lattice Strain Analysis of VPE-Grown ZnS Epitaxial...

Lattice Strain Analysis of VPE-Grown ZnS Epitaxial Layers on (001) GaAs by RBS - Channeling and High Resolution XRD Measurements

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Periodical:

Materials Science Forum (Volume 203)

Pages:

237-242

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.203.237

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Online since:

February 1996

Authors:

G. Leo, T. Peluso, N. Lovergine, Anna Maria Mancini, L. Vasanelli, C. Giannini, L. Tapfer, F. Romanato, A.V. Drigo

Keywords:

Ion Channeling, Strain Relaxation, X-Ray Diffraction (XRD), ZnS Epilayers

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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