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HomeMaterials Science ForumMaterials Science Forum Vol. 203Investigation of Interface Abruptness in Strained...

Investigation of Interface Abruptness in Strained InAs/In_0.53Ga_0.47As Quantum Wells

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Periodical:

Materials Science Forum (Volume 203)

Pages:

231-236

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.203.231

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Online since:

February 1996

Authors:

M.R. Bruni, N. Gambacorti, Saulius Kaciulis, G. Mattogno, M.G. Simeone, S. Viticoli

Keywords:

Depth Profile, Gallium Arsenide, Indium Arsenide, MBE, SIMS, X-Ray Photoelectron Spectroscopy (XPS)

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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