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HomeMaterials Science ForumMaterials Science Forum Vols. 204-206In-Situ Observations of Grain Boundary Migration

In-Situ Observations of Grain Boundary Migration

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Grain Growth in Polycrystalline Materials II

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Periodical:

Materials Science Forum (Volumes 204-206)

Pages:

99-108

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.204-206.99

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Online since:

March 1996

Authors:

Günter Gottstein, U. Czubayko, Dmitri A. Molodov, Lasar S. Shvindlerman, Wilfried Wunderlich

Keywords:

Bi-Crystal, Grain Boundary Migration, High Resolution Transmission Electron Microscopy, Impurity Drag, Mobility, Mobility Enhancement, Orientation Dependence, Thin Film, XICTD

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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