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HomeMaterials Science ForumMaterials Science Forum Vols. 207-209TEM Characterization of Invariant Line Interfaces...

TEM Characterization of Invariant Line Interfaces and Structural Ledges in a Mo-Si Alloy

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Intergranular and Interphase Boundaries in Materials II

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Periodical:

Materials Science Forum (Volumes 207-209)

Pages:

117-120

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.207-209.117

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Online since:

February 1996

Authors:

S.Q. Xiao, U. Dahmen, S.A. Maloy, A.H. Heuer

Keywords:

Electron Microscopy, Interface, Intermetallic, Invariant Line, Mo-Si, Partial Dislocations, Precipitation, Structural Ledges

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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