Investigation of Grain Boundary Migration in Al-Bicrystals by Continuous Tracking with X-Rays

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Periodical:

Materials Science Forum (Volumes 207-209)

Edited by:

A.C. Ferro, J.P. Conde and M.A. Fortes

Pages:

133-136

DOI:

10.4028/www.scientific.net/MSF.207-209.133

Citation:

D. A. Molodov et al., "Investigation of Grain Boundary Migration in Al-Bicrystals by Continuous Tracking with X-Rays", Materials Science Forum, Vols. 207-209, pp. 133-136, 1996

Online since:

February 1996

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$35.00

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