Kelvin Microprobe Investigation of the Surface Potential across Charged Grain Boundaries in Silicon

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 207-209)

Edited by:

A.C. Ferro, J.P. Conde and M.A. Fortes

Pages:

149-152

Citation:

A. Broniatowski et al., "Kelvin Microprobe Investigation of the Surface Potential across Charged Grain Boundaries in Silicon", Materials Science Forum, Vols. 207-209, pp. 149-152, 1996

Online since:

February 1996

Export:

Price:

$38.00

Fetching data from Crossref.
This may take some time to load.