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HomeMaterials Science ForumMaterials Science Forum Vols. 207-209Kelvin Microprobe Investigation of the Surface...

Kelvin Microprobe Investigation of the Surface Potential across Charged Grain Boundaries in Silicon

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Intergranular and Interphase Boundaries in Materials II

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Periodical:

Materials Science Forum (Volumes 207-209)

Pages:

149-152

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.207-209.149

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Online since:

February 1996

Authors:

A. Broniatowski, W. Nabhan, B. Equer, G. de Rosny

Keywords:

Charged Grain Boundaries, Contact Potential, Kelvin Microprobe, Silicon

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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