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HomeMaterials Science ForumMaterials Science Forum Vols. 207-209Diffusion Induced Grain Boundary Migration in...

Diffusion Induced Grain Boundary Migration in Cr-Doped Alumina during Internal Reduction

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Intergranular and Interphase Boundaries in Materials II

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Periodical:

Materials Science Forum (Volumes 207-209)

Pages:

169-172

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.207-209.169

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Online since:

February 1996

Authors:

M. Backhaus-Ricoult, A. Peyrot-Chabrol, S. Hagège

Keywords:

DIGM, Doped Alumina, Grain Boundary Migration, Internal Reduction

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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