Theoretical Study of Grain Boundaries in Silicon: Features of Atomic and Electronic Structures

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 207-209)

Edited by:

A.C. Ferro, J.P. Conde and M.A. Fortes

Pages:

265-268

DOI:

10.4028/www.scientific.net/MSF.207-209.265

Citation:

M. Kohyama "Theoretical Study of Grain Boundaries in Silicon: Features of Atomic and Electronic Structures", Materials Science Forum, Vols. 207-209, pp. 265-268, 1996

Online since:

February 1996

Authors:

Export:

Price:

$35.00

In order to see related information, you need to Login.