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HomeMaterials Science ForumMaterials Science Forum Vols. 207-209High Resolution Transmission Electron Microscope...

High Resolution Transmission Electron Microscope Investigations of Phases, Domains and Interfaces in Ti_50.5Al_46.5Cr₃/TiB₂ Composites

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Intergranular and Interphase Boundaries in Materials II

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Periodical:

Materials Science Forum (Volumes 207-209)

Pages:

313-316

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.207-209.313

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Online since:

February 1996

Authors:

X.G. Ning, David S. Wilkinson, Jian Fu Mao, J.H. Li, Heng Qiang Ye, Z.J. Pu, D.X. Zou

Keywords:

Domain, High Resolution Transmission Electron Microscopy, Interface, Ti_50.5Al_46.5Cr₃/TiB₂ Composites, TiB_x (x≈0.25) Phase

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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