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Characteristic Features of Grain Structure and Electron Properties of Thin Bismuth Films

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Periodical:

Materials Science Forum (Volumes 207-209)

Pages:

625-628

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.207-209.625

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Online since:

February 1996

Authors:

A.I. Il'in, A.V. Andreeva, B.N. Tolkunov

Keywords:

Bismuth, Boundary, Computer Modelling, Electron Microscopy, Film, Grain Structure, Resistance Measuring

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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