X-Ray Diffraction Characterization of Thin Superconductive Films

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Periodical:

Materials Science Forum (Volumes 210-213)

Edited by:

Anthony L. Bartos, Robert E. Green, Jr. and Clayton O. Ruud

Pages:

203-210

DOI:

10.4028/www.scientific.net/MSF.210-213.203

Citation:

K. J. Kozaczek et al., "X-Ray Diffraction Characterization of Thin Superconductive Films", Materials Science Forum, Vols. 210-213, pp. 203-210, 1996

Online since:

May 1996

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Price:

$35.00

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