Paper Titles

Acoustoelastic Determination of Stresses in Steel Using Rayleigh Ultrasonic Waves
p.171

The Eddy Current Technique for Determining Residual Stresses in Steels
p.179

Recent Developments in Non-Destructive Characterization of Aerosols by Synchrotron Radiation
p.187

Nondestructive Measurement of Grain Size in Steel Plate by X-Ray Diffraction
p.195

X-Ray Diffraction Characterization of Thin Superconductive Films
p.203

X-Ray Backscatter Tomography: NDT Potential and Limitations
p.211

An X-Ray Sensitive CCD Camera System and Its Application to the X-Ray Diffractometric Investigation on Area Selective Semiconductor Epitaxy
p.219

Determination of the Elastic Behaviour of Carbon-Reinforced Carbon Materials Using Laser-Ultrasound and Theoretical Modeling
p.227

Elastic Moduli Measurements of SiC Reinforced Alumina at High Temperatures Using Laser-Ultrasonics
p.235

HomeMaterials Science ForumMaterials Science Forum Vols. 210-213X-Ray Diffraction Characterization of Thin...

X-Ray Diffraction Characterization of Thin Superconductive Films

Article Preview

Abstract:

You might also be interested in these eBooks

Nondestructive Characterization of Materials VII

Info:

Periodical:

Materials Science Forum (Volumes 210-213)

Pages:

203-210

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.210-213.203

Citation:

Cite this paper

Online since:

May 1996

Authors:

Kris J. Kozaczek, G.W. Book, T.R. Watkins, W.B. Carter

Keywords:

High T_c Superconductors, Texture, Thin Film, X-Ray Diffraction (XRD)

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 1996 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: