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HomeMaterials Science ForumMaterials Science Forum Vols. 210-213X-Ray Backscatter Tomography: NDT Potential and...

X-Ray Backscatter Tomography: NDT Potential and Limitations

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Nondestructive Characterization of Materials VII

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Periodical:

Materials Science Forum (Volumes 210-213)

Pages:

211-218

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.210-213.211

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Online since:

May 1996

Authors:

C.F. Poranski, E.C. Greenawald, Young Sam Ham

Keywords:

Compton Scattering, Tomography, X-Ray, X-Ray Backscatter

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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