X-Ray Backscatter Tomography: NDT Potential and Limitations

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 210-213)

Edited by:

Anthony L. Bartos, Robert E. Green, Jr. and Clayton O. Ruud

Pages:

211-218

DOI:

10.4028/www.scientific.net/MSF.210-213.211

Citation:

C.F. Poranski et al., "X-Ray Backscatter Tomography: NDT Potential and Limitations", Materials Science Forum, Vols. 210-213, pp. 211-218, 1996

Online since:

May 1996

Export:

Price:

$35.00

In order to see related information, you need to Login.