p.239
p.247
p.253
p.259
p.265
p.269
p.275
p.281
p.289
Equipment for Residual Stress Measurements with the High Resolution Fourier Diffractometer: Present Status and Prospects
Abstract:
Info:
Periodical:
Pages:
265-268
Citation:
Online since:
July 1996
Authors:
Keywords:
Price:
Сopyright:
© 1996 Trans Tech Publications Ltd. All Rights Reserved
Share:
Citation: