Applications of a Thin Film Diffractometer

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Periodical:

Materials Science Forum (Volumes 228-231)

Edited by:

R.J. Cernik, R. Delhez and E.J. Mittemeijer

Pages:

289-294

Citation:

P. Van der Sluis "Applications of a Thin Film Diffractometer", Materials Science Forum, Vols. 228-231, pp. 289-294, 1996

Online since:

July 1996

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$38.00

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