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HomeMaterials Science ForumMaterials Science Forum Vols. 228-231The Crystal Structure and Texture Analyses of...

The Crystal Structure and Texture Analyses of Polycrystalline Thin Film Sample Using Multiple Diffraction Datasets Obtained by Asymmetric Diffraction Technique

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Periodical:

Materials Science Forum (Volumes 228-231)

Pages:

307-310

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.228-231.307

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Online since:

July 1996

Authors:

H. Toraya

Keywords:

Asymmetric Diffraction, Crystal Structure Analysis, Multiple Datasets, Parallel Beam Optics, Polycrystalline Thin Film, Preferred Orientation, Texture Analysis

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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