The Crystal Structure and Texture Analyses of Polycrystalline Thin Film Sample Using Multiple Diffraction Datasets Obtained by Asymmetric Diffraction Technique

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Periodical:

Materials Science Forum (Volumes 228-231)

Edited by:

R.J. Cernik, R. Delhez and E.J. Mittemeijer

Pages:

307-310

DOI:

10.4028/www.scientific.net/MSF.228-231.307

Citation:

H. Toraya "The Crystal Structure and Texture Analyses of Polycrystalline Thin Film Sample Using Multiple Diffraction Datasets Obtained by Asymmetric Diffraction Technique", Materials Science Forum, Vols. 228-231, pp. 307-310, 1996

Online since:

July 1996

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