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HomeMaterials Science ForumMaterials Science Forum Vols. 228-231Shallow Angle X-Ray Diffraction from In-Situ...

Shallow Angle X-Ray Diffraction from In-Situ Silica: Titania Sol-Gel Thin Films

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Periodical:

Materials Science Forum (Volumes 228-231)

Pages:

525-530

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.228-231.525

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Online since:

July 1996

Authors:

J.S. Rigden, R.J. Newport, M.E. Smith, P.J. Dirken

Keywords:

Diffraction, Sol-Gel Glass, Thin Film

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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