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HomeMaterials Science ForumMaterials Science Forum Vols. 228-231Characterization of Ni/C Multilayers with...

Characterization of Ni/C Multilayers with Fluorescence XAFS Experiments at Fixed Standing Wave Field Positions

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Periodical:

Materials Science Forum (Volumes 228-231)

Pages:

511-518

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.228-231.511

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Online since:

July 1996

Authors:

D.C. Meyer, T. Holz, R. Krawietz, K. Richter, B. Wehner, P. Paufler

Keywords:

Fluorescence EXAFS, Multilayer, Standing Waves, XAFS, X-Ray Reflectometry

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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