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HomeMaterials Science ForumMaterials Science Forum Vols. 228-231Characterization of a New Phase in WO3 Thin Films...

Characterization of a New Phase in WO₃ Thin Films Grown by Sol-Gel Method

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Periodical:

Materials Science Forum (Volumes 228-231)

Pages:

493-498

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.228-231.493

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Online since:

July 1996

Authors:

L. Sangaletti, L.E. Depero, L. Armelao

Keywords:

Sol-Gel (SG), Structural Property, Thin Film Studies, WO₃, X-Ray Diffraction (XRD)

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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