Paper Titles

Residual Stress in Plasma-Sprayed Ceramic Coatings
p.481

X-Ray Diffraction Microstructural Characterization of PZT (Pb(Zr_xTi_1-x)O₃ and Pt Thin Films on TiN/Ti/BPSG/Si Structures
p.487

Characterization of a New Phase in WO₃ Thin Films Grown by Sol-Gel Method
p.493

Structure Analysis of Annealed Polycrystalline Ag/NiFe Multilayers
p.499

X-Ray Reflectivity and Diffuse Scattering Study of Thermally Treated W_1-xSi_x/Si Multilayers
p.505

Characterization of Ni/C Multilayers with Fluorescence XAFS Experiments at Fixed Standing Wave Field Positions
p.511

X-Ray Diffraction Studies of Silica: Titania Sol-Gel Glasses
p.519

Shallow Angle X-Ray Diffraction from In-Situ Silica: Titania Sol-Gel Thin Films
p.525

X-Ray Powder Diffraction Investigation of the Metastable Phase Sr₂Ti₅O₁₂ Occurring in Hi-Tech Glass Ceramics
p.531

HomeMaterials Science ForumMaterials Science Forum Vols. 228-231X-Ray Reflectivity and Diffuse Scattering Study of...

X-Ray Reflectivity and Diffuse Scattering Study of Thermally Treated W_1-xSi_x/Si Multilayers

Article Preview

Abstract:

You might also be interested in these eBooks

$European Powder Diffraction 4$ View Preview

Info:

Periodical:

Materials Science Forum (Volumes 228-231)

Pages:

505-510

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.228-231.505

Citation:

Cite this paper

Online since:

July 1996

Authors:

Matej Jergel, E. Majková, V. Holý, R. Senderák, S. Luby

Keywords:

Annealing, Diffuse, Interface, Multilayer, Reflectivity, Scattering

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 1996 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: