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HomeMaterials Science ForumMaterials Science Forum Vols. 248-249Depth Resolved Oxygen Analysis at the Interfaces...

Depth Resolved Oxygen Analysis at the Interfaces of Au-Al Layers

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Materials Science Applications of Ion Beam Techniques

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Periodical:

Materials Science Forum (Volumes 248-249)

Pages:

163-166

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.248-249.163

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Online since:

May 1997

Authors:

A. Markwitz, G. Demortier

Keywords:

Au-Al Layers, Backscattering Spectroscopy, Interface Behaviour, Ion Beam Bombardement, Oxygen Analysis

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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