Recent Measurements and Theory Relating to Impurity-Induced LVMS in GaP and GaAs

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 258-263)

Edited by:

Gordon Davies and Maria Helena Nazaré

Pages:

1-10

DOI:

10.4028/www.scientific.net/MSF.258-263.1

Citation:

R.C. Newman et al., "Recent Measurements and Theory Relating to Impurity-Induced LVMS in GaP and GaAs", Materials Science Forum, Vols. 258-263, pp. 1-10, 1997

Online since:

December 1997

Export:

Price:

$35.00

In order to see related information, you need to Login.